Non-Arrhenius Degradation Model for Stress Relaxation in Electromagnetic Relay Using Accelerated Degradation Test
Year: 2024
Type: article
Source: IEEE Transactions on Reliability
Authors: Rao Fu, Shenghui Zhou, Huafeng Xing, Yigang Lin
Institution: Wenzhou University
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403520981