Machine Learning-Based Prediction of Threshold Voltage Distribution Due to Lateral Migration in 3-D NAND Flash Memory
Year: 2024
Type: article
Authors: Insang Han, Jang Kyu Lee, Sangmin Ahn, Hyungcheol Shin
Institution: Seoul National University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G3923353966
OpenAlex ID: W4403534592