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REACT: IR-Level Patch Presence Test for Binary

Year: 2024

Type: conference-paper

Source: IEEE/ACM International Conference on Automated Software Engineering (ASE)

DOI: 10.1145/3691620.3695012

Authors: Qi Zhan, Xing Hu, Xin Xia, Shanping Li

Institutions: Zhejiang University, Huawei Technologies (China)

Language: English

Topic: Security and Verification in Computing

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Fundamental Research Funds for the Central Universities

Award: G5286106294

OpenAlex ID: W4403536700

FWCI: 1.767

Cites: 29

Cited by: 6

Related to: 10