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GUI Test Repair Based on Test-Extension

Year: 2024

Type: conference-paper

Source: IEEE/ACM International Conference on Automated Software Engineering (ASE)

DOI: 10.1145/3691620.3695323

Authors: Yonghao Long, Yuanyuan Chen, Xiangping Chen

Institution: Sun Yat-sen University

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G8092339905

OpenAlex ID: W4403537994

FWCI:

Cites: 9

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Related to: 10