Work

Reduction in Optical Feedback Noise of Atomic Force Microscopy by High-Frequency Current Modulation

Year: 2024

Type: article

Source: Current Nanoscience

DOI: 10.2174/0115734137319121241007055422

Authors: Ke Xu, Wei Zheng

Institution: Shenyang Jianzhu University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: Department of Education of Liaoning Province, National Key Research and Development Program of China

Awards: G6234028110, G8074448831

OpenAlex ID: W4403616767

FWCI:

Cites: 20

Cited by:

Related to: 10