Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors
Year: 2024
Type: article
Abstract: CdZnTe-based detectors are highly valued because of their high spectral resolution, which is an essential feature for nuclear medical imaging. However, this resolution is compromised when there are substantial defects in the CdZnTe crystals. In this study, we present a learning-based approach to determine the spatially dependent bulk properties and defects in semiconductor detectors. This characterization allows us to mitigate and compensate for the undesired effects caused by crystal impurities. We tested our model with computer-generated noise-free input data, where it showed excellent accuracy, achieving an average RMSE of 0.43% between the predicted and the ground truth crystal properties. In addition, a sensitivity analysis was performed to determine the effect of noisy data on the accuracy of the model.
Source: Crystals
Authors: Manuel Ballester, Jaromir Kaspar, Francesc Massanés, Srutarshi Banerjee, Alexander Hans Vija, Aggelos K. Katsaggelos
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,955
Funder: Siemens Medical Solutions USA
OpenAlex ID: W4403873589
