Work

Compact and simple antenna inspection testing range for 5G smartphones

Year: 2024

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/ad89e9

Authors: Jisu Lee, Jinjoo Kim, Soonyoong Lee, Namkyoung Kim, Kyung-Young Jung

Institutions: Hanyang University, Samsung Electronics (South Korea)

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Samsung

OpenAlex ID: W4403628688

FWCI:

Cites: 21

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Related to: 10