Exposure Calibration Network With Graph Convolution for Low-Light Image Enhancement
Year: 2024
Type: article
Source: IEEE Sensors Journal
Authors: Santosh Kumar Panda, Pankaj Kumar Sa
Institution: National Institute of Technology Rourkela
Language: English
Topic: Image Enhancement Techniques
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Award: G7684351531
OpenAlex ID: W4403635681