Work

Speeding-Up Emerging Device Development Cycles by Generating Models via Machine-Learning directly from Electrical Measurements

Year: 2024

Type: conference-paper

DOI: 10.1109/esserc62670.2024.10719591

Authors: J. Trommer, M. Reuter, N. Bhattacharjee, Y. He, V. Sessi, M. Drescher, M. Zier, M. Simon, K. Ruttloff, K. Li, A. Zeun, A.-S. Seidel, C. Metze, M. Grothe, S. Jansen, G. Galderisi, V. Havel, S. Slesazeck, J. Hoentschel, K. Hofmann, T. Mikolajick

Institutions: NaMLab (Germany), Technische Universität Darmstadt, GlobalFoundries (Germany)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Ministry of Education

OpenAlex ID: W4403675876

FWCI: 3.906

Cites: 23

Cited by: 5

Related to: 10