Vertical Transfer Gate Shape Impact on Full Well and Transfer Capabilities in a Photogate Pixel
Year: 2024
Type: conference-paper
Authors: Louis Stephan, Jean-Pierre Carrère, Pierre Malinge, Emilie De Pretto, Eric Vire, Guo-Neng Lu
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403676207