Work

A Reliable 2 bit MLC FeFET with High Uniformity and 109 Endurance by Gate Stack and Write Pulse Co-optimization

Year: 2024

Type: conference-paper

DOI: 10.1109/esserc62670.2024.10719462

Authors: Yuejia Zhou, Weiqin Huang, Runteng Zhu, Ru Huang, Kechao Tang

Institution: Peking University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Peking University

OpenAlex ID: W4403677027

FWCI: 2.418

Cites: 15

Cited by: 3

Related to: 10