Work

Understanding the Electrical Impact of DTI Induced Dislocations on Smart Power Devices

Year: 2024

Type: conference-paper

DOI: 10.1109/esserc62670.2024.10719491

Authors: Michele Basso, Damiano Riccardi, Selene Colombo, Pierpaolo Monge Roffarello, Jacopo Frascaroli, Isabella Mica

Institution: STMicroelectronics (Italy)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403677093

FWCI:

Cites: 19

Cited by:

Related to: 10