Work

Deep Insight of Self-Heating Effect Induced Hot Carrier Reliability Improvement in LDMOS Devices

Year: 2024

Type: conference-paper

Source: IEEE International Conference on IC Design and Technology (ICICDT)

DOI: 10.1109/icicdt63592.2024.10717826

Authors: Jin Shao, Qianwen Guo, Bo Wu, Fang Liu, Yongfeng Deng, Chenrui Zhu, Dawei Gao, Junkang Li, Rui Zhang

Institution: Zhejiang University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Joint Research Fund for Overseas Chinese Scholars and Scholars in Hong Kong and Macao

Award: G5800823504

OpenAlex ID: W4403678530

FWCI: 4.836

Cites: 9

Cited by: 6

Related to: 10