Work

Fundamentals of Nanoprobe Analysis (2024 Update)

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024tpa1

Author: Randal Mulder

Institution: Silicon Labs (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403684643

FWCI:

Cites:

Cited by:

Related to: 10