A Practical Tutorial on ATE-Based Electrical Fault Isolation of Digital SoCs Using Photon Emission and Laser Voltage Imaging/Probing (2024 Update)
Year: 2024
Type: conference-paper
Author: Lesly Endrinal
Institution: Google (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403685102