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A Quantitative and Automated Quality Metric for Delayering Integrated Circuits

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0363

Authors: Noah Padro, Tim Balint, Nick Harner, Jon Scholl, Yash Patel, Matt Sale, Adam Kimura

Institutions: Battelle, United States Air Force Research Laboratory

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685251

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