Work

Enhancing Soft Defect Localization with Software Automated Intelligent Laser Scanning (SAILS)

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0035

Authors: Arun Karunanithi, Joseph Caroselli, Winston Gao, Aaron Liao

Institutions: Advanced Micro Devices (United States), The University of Texas at Austin

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685286

FWCI:

Cites:

Cited by:

Related to: 10