Work

Revolutionizing Failure Analysis: EBAC Nanoprobing Analysis Insights into Inaccessible Floating Gates of Advanced Tech Node Automotive NVMs

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0097

Authors: P.K. Tan, S.L. Ting, H.H.W. Thoungh, P.T. Ng, Alfred C.T. Quah, N.Y. Xu, T.T. Yu, Jessica Oh, Angela Teo, Y.S. Tam, K.K. Kang, C.Q. Chen

Institution: GlobalFoundries (Singapore)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685474

FWCI:

Cites:

Cited by:

Related to: 10