Work

Enhancing Semiconductor Nanoprobing Procedures with AI-Driven Tip Detection

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0001

Authors: David Stefan Kleindiek, Matthias Kemmler, Andreas Zell

Institution: University of Tübingen

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685480

FWCI: 0.229

Cites:

Cited by: 1

Related to: 10