Work

CMOS Integrated Circuit Analysis Using Superconducting Nanowire Single-Photon Detectors

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0119

Authors: Ravin A. Chowdhury, Jeff Chiles, Brandon Cage, Saeed Khan, Richard P. Mirin, Ryan O'Loughlin, Martin J. Stevens, Jeffrey M. Shainline

Institution: National Institute of Standards and Technology

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685493

FWCI:

Cites:

Cited by:

Related to: 10