Transmission Electron Imaging AND Diffraction in an SEM (aka, STEM-in-SEM): What, Why, and How To Do This in Your Microscope
Year: 2024
Type: conference-paper
Author: Jason Holm
Institution: National Institute of Standards and Technology
Language: English
Subfield: Structural Biology
Domain: Life Sciences
Open Access status: closed
OpenAlex ID: W4403685558
