Work

RF-LIT Use Case Studies

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0292

Authors: Marc van Veenhuizen, Eric Meeuwsen, Keying Lin, Maarten Nab, Mohammed Achour, Pieter Gommers, Varun Thukral

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403685585

FWCI: 0.781

Cites:

Cited by: 1

Related to: 10