Work

Optical Automated Interconnect Inspection of Printed Circuit Boards

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0022

Authors: Patrick Craig, Jonathan Pearson, Shajib Ghosh, Nitin Varshney, Sanjeev J. Koppal, Navid Asadizanjani

Institution: University of Florida

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403685611

FWCI: 1.441

Cites:

Cited by: 2

Related to: 10