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Analysis of 3row Failure Caused by Vulnerable Data Retention Failure Adjacent to Disconnected BCAT

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0157

Authors: Jongwon Nam, Youmin Kim, Jinhyeon Han, Sangho Kim, Hyunhee Jo, Seaeun Park, Kanghyuk Lee, Jihoon Kim, Ilwoo Jung, Dongin Lee, Byunghyun Lee, SeGuen Park

Institution: Samsung Electronics (South Korea)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685631

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