Enhanced Dynamic Laser Stimulation Method for Fault Isolation
Year: 2024
Type: conference-paper
Authors: Keonil Kim, Kyunghoon Shin, Ghil-Geun Oh
Institution: Samsung Electronics (South Korea)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403685694