Work

SRAM Single Bit Cell Soft Failure and Nanoprobing Methods

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0028

Authors: Zhigang Song, Michael Tenney, Larry Fischer, Dave Albert

Institution: IBM (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685713

FWCI: 0.806

Cites:

Cited by: 1

Related to: 10