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Heterogeneous Integrated Failure Analysis Using Radio Frequency Signal Detection/Injection with Power Spectrum Analysis

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0501

Authors: Joel T. Christiansen, Jeremy A. Walraven, Flora A. Coleman, Edmund H. Smith, Edward I. Cole

Institution: Sandia National Laboratories

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685766

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