Work

Failure Analysis of InGaAs/GaAs Nanoridge Lasers by Electron Beam Based Nanoprobing

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0297

Authors: Anjanashree M.R. Sharma, Ping-Yi Hsieh, Debi Prasad Panda, Kristof J.P. Jacobs, Didit Yudistira, Bernardette Kunert, Joris Van Campenhout, Jin Won Seo, Ingrid De Wolf, Jörg Jatzkowski, Frank Altmann

Institutions: IMEC, KU Leuven, Fraunhofer Institute for Microstructure of Materials and Systems

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685794

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