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Application of Advanced Dynamic Photon Emission Microscopy with Programmable Tester for Functional Failure Analysis of DRAM Devices

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0070

Authors: Hagyeong Kwon, Chae Soo Kim, Sunah Lee, Jihoon Park, Jihoon Son, Jeonghoon Baek, Seungchul Yew, Dong In Lee, Byeongheon Lee

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685871

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