Work

Studying the FT-IR Spectra of Flux at Different Curing Conditions for Semiconductor Applications

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0227

Authors: Sharmeeni Murugan, Sangeetha Thiagarajan, Amirul Fakri, Imadudina, Anamarliha

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403685922

FWCI:

Cites:

Cited by:

Related to: 10