Work

Advanced Package Fault Simulation—The Impact of Accelerated Trace Model Generation

Year: 2024

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2024p0469

Authors: Chuan Zhang, John Aguada, Joseph Sanchez, Arpan Bhattacherjee, Jane Y. Li

Institution: Nvidia (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403686220

FWCI: 0.806

Cites:

Cited by: 1

Related to: 10