Physical Origin of the Ferroelectric-Type Hysteresis in MIM Structures with Amorphous Dielectric Film
Year: 2024
Type: article
Institutions: Xidian University, Zhejiang Lab, Nankai University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403692097
