Year: 2024
Type: article
Abstract: High Resolution Image Download MS PowerPoint Slide Synchrotron infrared nanospectroscopy (SINS) is used to study the effect of disorder on the phonon polariton in amorphous SiO 2 . For SiO 2, it is known that the mid-infrared scattering spectrum is dominated by a surface phonon polariton mode associated with antisymmetric (AS) stretching. This excitation has a benchmark role in SINS studies. In this work, an amorphous 50 nm SiO 2 film, on a crystalline Si(100) substrate, is irradiated with 25 keV fluorine anions and fluence of 1.3 × 10 15 ions/cm 2, modifying the two asymmetric stretches (AS 1 and AS 2 ) present in the SINS spectrum. The dominating peak corresponding to the SiO 2 surface phonon polariton mode, AS 1, has a maximum intensity that is affected by irradiation and shows a shoulder identified with a suboxide SiO x component (with x < 2) due to defects. On the other hand, the surface phonon polariton mode AS 2 is completely suppressed by irradiation. In addition, calculations based on the finite dipole model (FDM) indicate that the polariton measured in the irradiated sample corresponds to the light–matter interaction at the surface of an effective medium combining the SiO 2 and SiO regions.
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $4,500
Award: G3690646728
OpenAlex ID: W4403692978