Work

SIMS analysis of an oxide thin film with continuous composition gradient

Year: 2024

Type: conference-paper

Abstract: International audience

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Scola, Joseph, Jomard, François, Wolfman, Jérôme, Negulescu, Béatrice, Pinault-Thaury, M.A.

Institutions: Groupe d’Étude de la Matière Condensée, GREMAN, Matériaux, Microélectronique, Acoustique, Nanotechnologies

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4403710655

FWCI:

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Related to: 10