Work

Resistive Switching Characteristics of NiO Thin Films Influenced by Changes in the Diameter of Nanometer-Scale Top Electrodes

Year: 2024

Type: article

Source: The Journal of Physical Chemistry Letters

DOI: 10.1021/acs.jpclett.4c02389

Authors: Eunmi Lee, Jong Yeog Son

Institutions: Korea University, Kyung Hee University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403718050

FWCI: 0.416

Cites: 27

Cited by: 4

Related to: 10