Machine Learning-Based Monitoring Trail: On Fast and Accurate Optical Path Failure Localization in All-Optical DCNs
Year: 2024
Type: article
Source: Journal of Lightwave Technology
Authors: Zhipeng Zhao, Lei Guo, Bin Wu
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403721997
