Super-Lamination HZO/ZrO₂/HZO of Ferroelectric Memcapacitors With Morphotropic Phase Boundary (MPB) for High Capacitive Ratio and Non-Destructive Readout
Year: 2024
Type: article
Source: IEEE Electron Device Letters
Authors: Z.-F. Lou, B.-R. Chen, K.-Y. Hsiang, Y.-T. Chang, C.-H. Liu, H.-C. Tseng, H.-T. Liao, P. Su, M. H. Lee
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G272663077, G7711372344
OpenAlex ID: W4403722410
