A Compact Single-Pixel Spectral Measurement System
Year: 2024
Type: article
Abstract: A compact single-pixel spectral measurement system based on semiconductor diodes is described in this work. There are no optical components in the system configuration, which contribute to reducing the size of the equipment. Incident spectra can be reconstructed by using the photocurrent of semiconductor diode and spectral response functions. After data collection, data analysis, algorithm processing and other steps.The existing equipment can accurately reconstruct the spectra of narrowband monochromatic light at 508–556 nm and broadband light sources in the 478–598 nm wavelength range, achieving high resolution of 6 nm broadband spectra. The peak signal-to-noise ratio (PSNR) of the reconstructed spectra can reach up to 33.44 dB.
Source: IEEE photonics journal
Authors: Peiqi Yang, Mingju Xin, Yaopeng Wei, Chuanxin Teng, Ming Chen, Yu Cheng, Jun Yin, Libo Yuan, Shijie Deng
Institution: Guilin University of Electronic Technology
Language: English
Subfield: Acoustics and Ultrasonics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $1,995
OpenAlex ID: W4403722842