Enhanced Estimation of IGBT Remaining Useful Life Using an Optimized LSTM Model
Year: 2024
Type: conference-paper
Authors: Shuntian Xie, Wenbo Luo, Lingfei Li, Ting Hou, Xiaojun Tang, Yihong Huang
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403723026
