Multi-Infeed SCR Margin Evaluation Method Considering DC Terminal Location Selection
Year: 2024
Type: conference-paper
Authors: Zhijuan Zhang, Xiaowei Yu, Minxiao Han, Hongmei Luo
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403723172
