Year: 2024
Type: article
Abstract: We describe an ultra-compact setup for in situ X-ray diffraction on the inelastic X-ray scattering beamline ID20 at the European Synchrotron Radiation Facility. The main motivation for the design and construction of this setup is the increasing demand for on-the-fly sample characterization, as well as ease of navigation through a sample's phase diagram, for example subjected to high-pressure and/or high-temperature conditions. We provide technical details and demonstrate the performance of the setup.
Source: Journal of Synchrotron Radiation
Authors: Christoph J. Sahle, Marta Majkut, Kari O. Ruotsalainen, Florent Gerbon, Noora Suomalainen, Marie-Claire Lagier, Blanka Detlefs, Laurent Claustre, Alessandro Mirone, Alessandro Longo
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,890
OpenAlex ID: W4403749546