Hot carrier transfer from plasmon decay in Ag20 at H–Si(111) surface: real-time TDDFT simulation in Wannier gauge
Year: 2024
Type: article
Authors: John L Bost, Christopher Shepard, Yosuke Kanai
Institution: University of North Carolina at Chapel Hill
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W4403757069
