Work

Development of an ESD Risk Evaluation Method for SSD Installation in Host Systems

Year: 2024

Type: conference-paper

Source: International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)

DOI: 10.1109/emceurope59828.2024.10722700

Authors: Heesu Kim, Nam-Su Kim, Youngmin Ku, Chunghyun Ryu, Junsik Park

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403759305

FWCI:

Cites: 4

Cited by:

Related to: 10