Work

Fundamental Study on Detection of Counterfeit Parts with Abnormal Aging Characteristics Using Electromagnetic Backscattering from I/O Circuits

Year: 2024

Type: conference-paper

Source: International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)

DOI: 10.1109/emceurope59828.2024.10722575

Authors: Shugo Kaji, Masahiro Kinugawa, Daisuke Fujimoto, Yuichi Hayashi

Institutions: Nara Institute of Science and Technology, University of Fukuchiyama

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science

Awards: Development Framework of VLSI Circuits and Systems Free from Hardware Trojans, 物理層のデータ改ざんに対抗する環境電磁工学的アプローチによる対策基盤の開拓

OpenAlex ID: W4403759606

FWCI:

Cites: 10

Cited by:

Related to: 10