A Statistically Evaluated Decision Tree Approach for SI-Compliant PCB Design
Year: 2024
Type: conference-paper
Authors: Emre Ecik, Werner John, Julian Withöft, Ralf Brüning, Jürgen Götze
Institution: TU Dortmund University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4403759871