Work

Surges Induced in Secondary Circuits Due to Very-Fast Transients in Primary Circuits: Experimental Study Using a Test Platform

Year: 2024

Type: conference-paper

Source: International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)

DOI: 10.1109/emceurope59828.2024.10722547

Authors: Daiki Tashiro, Akiyoshi Tatematsu, Norito Yoshizaki

Institution: Central Research Institute of Electric Power Industry

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403759902

FWCI: 0.806

Cites: 17

Cited by: 1

Related to: 10