Work

Analysis of Near Field Radiation at LPDDR5 DRAM with Various Operation Modes

Year: 2024

Type: conference-paper

Source: International Symposium on Electromagnetic Compatibility - EMC Europe (EMC Europe)

DOI: 10.1109/emceurope59828.2024.10722374

Authors: Jun-Bae Kim, Taeho Kim, Jung Hoon Cho, Chang Soo Yoon, Janghoo Kim, Yoo-Chang Sung, Seung-Jun Bae, Tae-Young Oh

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403760176

FWCI: 0.806

Cites: 4

Cited by: 1

Related to: 10