Work

Training-Free Parameter Extraction for Compact Device Models Using Sequential Bayesian Optimization With Adaptive Sampling

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3478177

Authors: Om Maheshwari, Aishwarya Singh, Nihar R. Mohapatra

Institution: Indian Institute of Technology Gandhinagar

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Ministry of Education, India

OpenAlex ID: W4403761660

FWCI: 0.728

Cites: 14

Cited by: 7

Related to: 10