Work

Long-Term Reliability of Shape Memory Wires: Analysis of the Influence of Different Activation Profiles on the Degradation Behavior and Lifetime

Year: 2024

Type: conference-paper

Source: ASME Conference on Smart Materials, Adaptive Structures and Intelligent Systems (SMASIS)

DOI: 10.1115/smasis2024-140251

Authors: Philipp Heß, Tobias Schmelter, Bernd Kuhlenkötter, Stefan Bracke

Institutions: University of Wuppertal, Ruhr University Bochum

Language: English

Topic: Shape Memory Alloy Transformations

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403837649

FWCI: 1.955

Cites:

Cited by: 1

Related to: 10