Work

Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs

Year: 2024

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.4c10888

Authors: Luca Panarella, Stanislav Tyaginov, Ben Kaczer, Quentin Smets, Devin Verreck, Alexander Makarov, Tom Schram, Dennis Lin, César Javier Lockhart de la Rosa, Gouri S. Kar, Valeri Afanas’ev

Institutions: IMEC, KU Leuven

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Fonds Wetenschappelijk Onderzoek, H2020 Future and Emerging Technologies

Awards: G540058282, Characterization of defects and reliability on Transition Metal Dichalcogenide (MX2) Based Field-Effect Devices

OpenAlex ID: W4403841877

FWCI: 0.663

Cites: 57

Cited by: 7

Related to: 10